Despeckling PolSAR Images With a Structure Tensor Filter

Authors: Santana Cedrés, Daniel; Gómez Déniz, Luis; Alvarez, Luis; Frery, Alejandro C.
Line of Research: Biometric analysis
Year: 2019
Type of Publication: Article
Keywords: Speckle;Stochastic processes;Image edge detection;Standards;Estimation;Scattering;Despeckling;Monte Carlo;structure tensor;synthetic aperture radar polarimetry
Journal: IEEE Geoscience and Remote Sensing Letters
Pages: 1-3