Robust Detection and Ordering of Ellipses on a Calibration Pattern

Authors: Alvarez, Luis; Salgado de la Nuez, Agustín J.; Sánchez Pérez, Javier
Line of Research: Stereoscopic and three-dimensional reconstruction of scenes
Year: 2007
Type of Publication: Article
Keywords: ami
Journal: Pattern Recognition and Image Analysis
Volume: 17(4)
Pages: 508–522